11/11/2010, IBM - Semiconductor Test

VIEW LOT CATALOG By Order of IBM, Surplus Semiconductor Tools Including: Test, Analysis & Repair and Fab Equipment Hopewell Junction, New York USA FEATURING: (4) HP 82000 Test Systems Zeiss LSM-310 Confocal Laser Scanning Microscope Hitachi S800T Scanning Electron Microscope Perkin Elmer 5100 Metal Analysis Tool SemiTest SCA-2000 Surface Charge Analyzer Versa Clean 1200 BOC Eco-Snow Blast Cleaning Tool (2) KLA CRS3100 Laser Imaging Confocal Defect Review Stations (10) Tencor TF-2 Film Thickness Measurement Tools (14) ASML 300mm Wafer Tables OptoMetrix Thermal Mapper / Optical Interf